Advance™ Inspection Machine for Surface Defects of Enameled wires or Bare Cu/AL

● It has Image algorithm from deep mathematical modeling.

● With adaptive sensitivity.

● With CNN deep algorithm.

● With special wavelength light, high brightness and specialized structure.

● With excellent lighting angle and color temperature.

● Of good quality, stability and relief.

● Its performance is testified in the compatible experiment.

● With 0.03 second of image reading speed.

● With deep algorithm optimization and millisecond processing.

● It supports line speed up to 400m / min.

● It resists interference from water droplet jitters.

● It is resistant to external daylight, fluorescent lights, and other bad conditions.

● It is a combination of lightening method and algorithm to achieve anti-interference.

● It’s fast and simple to touch the monitor screen.

● It has the ability of automatic recognition and marking of defective parts.

● The camera supporting function can be adjusted timely.

● With the ability of R & D development.

● Experienced and professional engineers.